The XT Series tester’s embedded non-volatile memory can hold up to 8 MB of test report data.
As a rule of thumb, the memory should hold around 1000 test reports.
A test record is created when the operator opts to save the data of a completed test.
Test modes that support data logging are:
• Power Quality
• Primary Secondary Analysis
• Secondary Burden
• Admittance
The test results can be accessed by clicking on the Records tab at the bottom of the screen.
The maximum number of test reports that can be held into the nonvolatile memory of the ST-3/XT3 depends on the test type and number of test groups created.
In any case, the amount of memory should be enough to hold well over a month’s worth of test data.