Probewell | XT Series | What is the Secondary Burden test?

What is the Secondary Burden test?





 Secondary Burden test 

What is the Secondary Burden test?
The Secondary Burden test is used to analyze the effect of a resistive burden on the behaviour of the CT. Within the ST-3/XT3 is an array of high accuracy resistors that can be, with the use of electromechanical relays, added to the secondary path of the CT to cause burden.

How does it work?
There are no prerequisites for running the Secondary Burden test.

By applying a resistance in series with the CT, the tester can analyze the maximum burden under which CT can still operate efficiently.
  1. The available burden values are 0.1, 0.2, 0.5, 1.0, 2.0 and 4.0 Ohms.
  2. The Secondary Burden test steps through the available burden values and measures the primary (if an accessory is connected) and secondary current  values.
  3. This process is repeated for each of the service lines (A, B and C).
  4. The test automatically stops when it reaches the maximum burden value that can be applied on the CT, as configured in the CT setup interface prior to starting the test.

For more details see PW-Connect XT Series User Guide.



    • Related Articles

    • What is the Primary Secondary Analysis test?

      Primary Secondary Analysis test  What is the Primary Secondary Analysis test? This test is to ensure that the ratio between the primary current or voltage and the secondary current or voltage are the same as indicated on the transformers being ...
    • What is Admittance test?

        Admittance test  What is the Admittance test? This test is conducted by injecting a small, 1,525 Hz audio frequency into the CT secondary, then measuring the audio frequency's induced current to determine the admittance value.  Analog filtering and ...
    • How does the admitance test work?

      By injecting a small audio signal of 1525 Hz into the CT secondary, then measuring the induced current of the audio frequency to determine the admittance value. Analog filtering and programmable gain are used to get the best dynamic range for the DSP ...
    • How many tests reports does the unit store internally?

      The XT series tester’s embedded non-volatile memory can hold up to 8 MB of test report data. As a rule of thumb, the memory should hold around 1000 test reports. A test record is created when the operator opts to save the data of a completed test. ...
    • How can I export my Data?

      The Probewell Connect application offers two data exports formats for XT series test reports: PDF and CSV. In both cases, test data is extracted from the XT tester’s non-volatile memory and saved on a local drive on a Windows computer. The PDF report ...